Plataforma Multiaplicación - MAP-200
The JDSU Multiple Application Platform (MAP-200) is an optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements. Today's rapidly changing optical market requires investment in productivity-enhancing technologies and tools, making the MAP-200 scalable test platform the right tool needed in even the most stringent environments. Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform.
The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing. Applications Enables transceiver and transponder testing .
Permits comprehensive passive and active component, laser, and amplifier testing
Facilitates 10 G and 40 G system and subsystem testing
MAP Broadband Source
MAP Erbium-Doped Fiber Amplifier
MAP Fabry-Perot Laser
MAP Large Channel Count Switch
MAP Light Emitting Diode Source
MAP Insertion Loss and Return Loss Test Modules
MAP Polarization Controller
MAP Optical Power Meter
MAP Small Channel Count Switch
MAP Swept Wavelength Test System
MAP Tunable Filter
MAP Utility
MAP Variable Backreflector
MAP Variable Optical Attenuator
MAP Tunable DBR Laser
Laser Technology c/ Mestre J. Jambert,8, 08348 Cabrils - Barcelona | Tfno: +34 937 500 121